Vol. 7, Special Issue 6 (2019)
Combining ability for grain yield and its components through line X tester mating design in wheat
Author(s): Sunil Kumar Jatav and VS Kandalkar
Abstract: Combining ability analysis for grain yield and other related charterers was studied in 7 lines, 3 testers and 21 F1’s in a randomized block design with two replications. The analysis of genetic components revealed that both additive as well as non-additive components were prevalent for the control of grain yield and its components. The combining ability effects revealed that parent DL 803-3 was identified as good general combiners for grain yield and GW190 and GW 173 for grain yield. The significant specific good combing cross ‘GW 322 X GW 173’ having one promising parent for grain yield would be advanced through simple or recurrent selection in segregating generations. Most of the good specific combinations for various characters involved parents with high X low or low X low or low X high GCA effects. These genotypes may be used in breeding programs targeting high potential under drought stress. These parents may be used for varietal improvement through the simple or recurrent selection in separating generations to increase in yield potential of wheat. This may lead in the fixation of both additive and non-additive components while making development in grain yield and its characteristics.
Pages: 104-106 | 852 Views 164 Downloads
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How to cite this article:
Sunil Kumar Jatav and VS Kandalkar. Combining ability for grain yield and its components through line X tester mating design in wheat. International Journal of Chemical Studies. 2019; 7(6): 104-106.
