Vol. 2, Issue 5 (2015)
X-ray diffraction line profile analysis of Ba0.6Sr0.4FexTi(1-x) O3-δ, (x=0.4)
Author(s): Reenu Jacob and Jayakumari Isac
Abstract: BSFTO nanoparticles prepared by solid state technique are characterized by X-ray diffraction analysis (XRD) and SEM. The crystallite development in the BSFTO is investigated by X-ray peak broadening methods like Scherrer method, Williamson Hall (W-H) plot analysis and Size -Strain plot method. The contributions of dislocation density due to crystallite size are also evaluated. A well-defined perovskite phase with tetragonal system is observed from the XRD data. The results showed that the mean crystallite size of the BSFTO estimated from the different methods are highly inter correlated. SEM data revealed that BSFTO has nano crystallite size and EDAX spectrum confirmed its elemental composition.
Fig. 1: Surface Morphology of BSFTO.
Pages: 12-21 | 2077 Views 171 Downloads
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How to cite this article:
Reenu Jacob, Jayakumari Isac. X-ray diffraction line profile analysis of Ba0.6Sr0.4FexTi(1-x) O3-δ, (x=0.4). Int J Chem Stud 2015;2(5):12-21.
